Microfocus and Nanofocus - phoenix microme| x DXR-HD

phoenix microme| x DXR-HD The phoenix microme| x DXR-HD is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection ( µ AXI) . Feature : Innovative and unique features and an extreme high positioning accuracy make the system the effective and reliable solution for a wide spectrum of 2D and 3D inspection tasks: R& D, failure analysis, process and quality control as well as automated offline inspection. Optional the system can be equipped with Computed Tomography. The phoenix| x-ray x| act technology offers easy to program CAD based ¼ AXI ensuring automated inspection in the micrometer range. Another unique benefit is GE´ s highly dynamic DXR flat panel detector with active cooling. Offering up to 30 frames per second, it provides outstanding brilliant live imaging and fast 10 second 3D scans. Key Features • High magnification • 180 kV / 20 W high-power microfocus tube with up to 0, 5µ m detail detectability • Brilliant live images by high dynamic temperature-stabilized GE DXR digital detector with 30 fps ( frames per second) • x| act software package for easy and fast CAD based high-resolution automated X-ray inspection ( ¼ AXI) for extremely high defect coverage with high magnification and repeatability • Precise Manipulation • High repeatability • 3D computed tomography scans within 10 seconds ( optional) Customer Benefits • Extremely high defect coverage and repeatability • Outstanding ease-of-use • Up to 2 times faster data acquisition at the same high image quality level by diamond| window as a new standard • Combined 2D / 3D CT operation Informasi lebih lanjut hubungi kontak dibawah ini: Office : Jl.Radin Inten II No 61 B Duren Sawit Jakarta Timur Phone : 021-29563045 ( hunting) Hp : 08156141954 Fax : 021-29563052 Pin BB : 284152F7 Email : sales@ testingindonesia.com Website : www.testingindonesia.com